Sijin Sun, Ming Deng, Jiawei Luo, Xiaohang Zheng, Yang Pan. ST-YOLO: An Improved Metal Defect Detection Model Based on Yolov5. In Proceedings of the 2024 3rd Asia Conference on Algorithms, Computing and Machine Learning, CACML 2024, Shanghai, China, March 22-24, 2024. pages 158-164, ACM, 2024. [doi]
@inproceedings{SunDLZP24,
title = {ST-YOLO: An Improved Metal Defect Detection Model Based on Yolov5},
author = {Sijin Sun and Ming Deng and Jiawei Luo and Xiaohang Zheng and Yang Pan},
year = {2024},
doi = {10.1145/3654823.3654852},
url = {https://doi.org/10.1145/3654823.3654852},
researchr = {https://researchr.org/publication/SunDLZP24},
cites = {0},
citedby = {0},
pages = {158-164},
booktitle = {Proceedings of the 2024 3rd Asia Conference on Algorithms, Computing and Machine Learning, CACML 2024, Shanghai, China, March 22-24, 2024},
publisher = {ACM},
}