Adversarial Sample Generation for Lithography Hotspot Detection - researchr publication authors

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Shuyuan Sun, Yiyang Jiang, Fan Yang, Xuan Zeng 0001. Adversarial Sample Generation for Lithography Hotspot Detection. In IEEE International Symposium on Circuits and Systems, ISCAS 2022, Austin, TX, USA, May 27 - June 1, 2022. pages 3503-3506, IEEE, 2022. [doi]

This author has not been identified. Look up 'Shuyuan Sun' in GoogleThis author has not been identified. Look up 'Yiyang Jiang' in GoogleThis author has not been identified. Look up 'Fan Yang' in GoogleThis author has not been identified. Look up 'Xuan Zeng 0001' in Google

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