Xiaoyun Sun, Larry L. Kinney, Bapiraju Vinnakota. Test Vector Generation Based on Correlation Model for Ratio-Iddq. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 545-554, IEEE Computer Society, 2003. [doi]
@inproceedings{SunKV03,
title = {Test Vector Generation Based on Correlation Model for Ratio-Iddq},
author = {Xiaoyun Sun and Larry L. Kinney and Bapiraju Vinnakota},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/itc/2003/2063/00/20630545abs.htm},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/SunKV03},
cites = {0},
citedby = {0},
pages = {545-554},
booktitle = {Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA},
publisher = {IEEE Computer Society},
isbn = {0-7803-8106-8},
}