Xiaoyun Sun, Larry L. Kinney, Bapiraju Vinnakota. Test Vector Generation Based on Correlation Model for Ratio-Iddq. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 545-554, IEEE Computer Society, 2003. [doi]
Abstract is missing.