Fast statistical analysis of rare circuit failure events via subset simulation in high-dimensional variation space - researchr publication authors

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Shupeng Sun, Xin Li. Fast statistical analysis of rare circuit failure events via subset simulation in high-dimensional variation space. In Yao-Wen Chang, editor, The IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2014, San Jose, CA, USA, November 3-6, 2014. pages 324-331, IEEE/ACM, 2014. [doi]

This author has not been identified. Look up 'Shupeng Sun' in GoogleThis author has not been identified. Look up 'Xin Li' in Google

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