Shupeng Sun, Xin Li. Fast statistical analysis of rare circuit failure events via subset simulation in high-dimensional variation space. In Yao-Wen Chang, editor, The IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2014, San Jose, CA, USA, November 3-6, 2014. pages 324-331, IEEE/ACM, 2014. [doi]
Abstract is missing.