Shupeng Sun, Xin Li. Fast statistical analysis of rare circuit failure events via Bayesian scaled-sigma sampling for high-dimensional variation space. In 2015 IEEE Custom Integrated Circuits Conference, CICC 2015, San Jose, CA, USA, September 28-30, 2015. pages 1-4, IEEE, 2015. [doi]
@inproceedings{SunL15-5, title = {Fast statistical analysis of rare circuit failure events via Bayesian scaled-sigma sampling for high-dimensional variation space}, author = {Shupeng Sun and Xin Li}, year = {2015}, doi = {10.1109/CICC.2015.7338409}, url = {http://dx.doi.org/10.1109/CICC.2015.7338409}, researchr = {https://researchr.org/publication/SunL15-5}, cites = {0}, citedby = {0}, pages = {1-4}, booktitle = {2015 IEEE Custom Integrated Circuits Conference, CICC 2015, San Jose, CA, USA, September 28-30, 2015}, publisher = {IEEE}, isbn = {978-1-4799-8682-8}, }