The following publications are possibly variants of this publication:
- Fast statistical analysis of rare circuit failure events via scaled-sigma sampling for high-dimensional variation spaceShupeng Sun, Xin Li, Hongzhou Liu, Kangsheng Luo, Ben Gu. iccad 2013: 478-485 [doi]
- Fast Statistical Analysis of Rare Circuit Failure Events via Scaled-Sigma Sampling for High-Dimensional Variation SpaceShupeng Sun, Xin Li, Hongzhou Liu, Kangsheng Luo, Ben Gu. tcad, 34(7):1096-1109, 2015. [doi]
- Fast statistical analysis of rare circuit failure events via subset simulation in high-dimensional variation spaceShupeng Sun, Xin Li. iccad 2014: 324-331 [doi]
- Fast statistical analysis of rare failure events for memory circuits in high-dimensional variation spaceShupeng Sun, Xin Li. aspdac 2015: 302-307 [doi]