Shupeng Sun, Xin Li, Hongzhou Liu, Kangsheng Luo, Ben Gu. Fast statistical analysis of rare circuit failure events via scaled-sigma sampling for high-dimensional variation space. In Jörg Henkel, editor, The IEEE/ACM International Conference on Computer-Aided Design, ICCAD'13, San Jose, CA, USA, November 18-21, 2013. pages 478-485, IEEE/ACM, 2013. [doi]
Abstract is missing.