Variation tolerant sensing scheme of Spin-Transfer Torque Memory for yield improvement - researchr publication authors

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Zhenyu Sun, Hai Li, Yiran Chen, XiaoBin Wang. Variation tolerant sensing scheme of Spin-Transfer Torque Memory for yield improvement. In 2010 International Conference on Computer-Aided Design (ICCAD 10), November 7-11, 2010, San Jose, CA, USA. pages 432-437, IEEE, 2010. [doi]

This author has not been identified. Look up 'Zhenyu Sun' in GoogleThis author has not been identified. Look up 'Hai Li' in GoogleThis author has not been identified. Look up 'Yiran Chen' in GoogleThis author has not been identified. Look up 'XiaoBin Wang' in Google

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