Zhenyu Sun, Hai Li, Yiran Chen, XiaoBin Wang. Variation tolerant sensing scheme of Spin-Transfer Torque Memory for yield improvement. In 2010 International Conference on Computer-Aided Design (ICCAD 10), November 7-11, 2010, San Jose, CA, USA. pages 432-437, IEEE, 2010. [doi]
@inproceedings{SunLCW10,
title = {Variation tolerant sensing scheme of Spin-Transfer Torque Memory for yield improvement},
author = {Zhenyu Sun and Hai Li and Yiran Chen and XiaoBin Wang},
year = {2010},
doi = {10.1109/ICCAD.2010.5653720},
url = {http://dx.doi.org/10.1109/ICCAD.2010.5653720},
researchr = {https://researchr.org/publication/SunLCW10},
cites = {0},
citedby = {0},
pages = {432-437},
booktitle = {2010 International Conference on Computer-Aided Design (ICCAD 10), November 7-11, 2010, San Jose, CA, USA},
publisher = {IEEE},
}