Fast Statistical Analysis of Rare Circuit Failure Events via Scaled-Sigma Sampling for High-Dimensional Variation Space - researchr publication authors

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Shupeng Sun, Xin Li, Hongzhou Liu, Kangsheng Luo, Ben Gu. Fast Statistical Analysis of Rare Circuit Failure Events via Scaled-Sigma Sampling for High-Dimensional Variation Space. IEEE Trans. on CAD of Integrated Circuits and Systems, 34(7):1096-1109, 2015. [doi]

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