Shupeng Sun, Xin Li, Hongzhou Liu, Kangsheng Luo, Ben Gu. Fast Statistical Analysis of Rare Circuit Failure Events via Scaled-Sigma Sampling for High-Dimensional Variation Space. IEEE Trans. on CAD of Integrated Circuits and Systems, 34(7):1096-1109, 2015. [doi]
@article{SunLLLG15,
title = {Fast Statistical Analysis of Rare Circuit Failure Events via Scaled-Sigma Sampling for High-Dimensional Variation Space},
author = {Shupeng Sun and Xin Li and Hongzhou Liu and Kangsheng Luo and Ben Gu},
year = {2015},
doi = {10.1109/TCAD.2015.2404895},
url = {http://dx.doi.org/10.1109/TCAD.2015.2404895},
researchr = {https://researchr.org/publication/SunLLLG15},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {34},
number = {7},
pages = {1096-1109},
}