Peng Sun, Yun Li, Yao Yao, Peng-fei Wang. Study for NOR Flash cell burn out failure improvement in the advanced node below 65nm. In 13th IEEE International Conference on ASIC, ASICON 2019, Chongqing, China, October 29 - November 1, 2019. pages 1-4, IEEE, 2019. [doi]
Abstract is missing.