Xiaoling Sun, Micaela Serra. Merging Concurrent Checking and Off-line BIST. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 958-967, IEEE Computer Society, 1992.
@inproceedings{SunS92,
title = {Merging Concurrent Checking and Off-line BIST},
author = {Xiaoling Sun and Micaela Serra},
year = {1992},
researchr = {https://researchr.org/publication/SunS92},
cites = {0},
citedby = {0},
pages = {958-967},
booktitle = {Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992},
publisher = {IEEE Computer Society},
isbn = {0-7803-0760-7},
}