Merging Concurrent Checking and Off-line BIST

Xiaoling Sun, Micaela Serra. Merging Concurrent Checking and Off-line BIST. In Proceedings IEEE International Test Conference 1992, Discover the New World of Test and Design, Baltimore, Maryland, USA, September 20-24, 1992. pages 958-967, IEEE Computer Society, 1992.

Abstract

Abstract is missing.