A Novel Three-Probability Spaces Logic Decoupling Distillation for Flip-Chip Defect Detection

Yu Sun, Lei Su, Jiefei Gu, Ke Li, Michael G. Pecht. A Novel Three-Probability Spaces Logic Decoupling Distillation for Flip-Chip Defect Detection. IEEE T. Instrumentation and Measurement, 72:1-10, 2023. [doi]

Authors

Yu Sun

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Lei Su

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Jiefei Gu

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Ke Li

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Michael G. Pecht

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