A Novel Three-Probability Spaces Logic Decoupling Distillation for Flip-Chip Defect Detection

Yu Sun, Lei Su, Jiefei Gu, Ke Li, Michael G. Pecht. A Novel Three-Probability Spaces Logic Decoupling Distillation for Flip-Chip Defect Detection. IEEE T. Instrumentation and Measurement, 72:1-10, 2023. [doi]

Abstract

Abstract is missing.