Yu Sun, Lei Su, Jiefei Gu, Ke Li, Michael G. Pecht. A Novel Three-Probability Spaces Logic Decoupling Distillation for Flip-Chip Defect Detection. IEEE T. Instrumentation and Measurement, 72:1-10, 2023. [doi]
@article{SunSGLP23,
title = {A Novel Three-Probability Spaces Logic Decoupling Distillation for Flip-Chip Defect Detection},
author = {Yu Sun and Lei Su and Jiefei Gu and Ke Li and Michael G. Pecht},
year = {2023},
doi = {10.1109/TIM.2023.3284130},
url = {https://doi.org/10.1109/TIM.2023.3284130},
researchr = {https://researchr.org/publication/SunSGLP23},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {72},
pages = {1-10},
}