Accelerating electromigration aging for fast failure detection for nanometer ICs

Zeyu Sun, Sheriff Sadiqbatcha, Hengyang Zhao, Sheldon X.-D. Tan. Accelerating electromigration aging for fast failure detection for nanometer ICs. In 23rd Asia and South Pacific Design Automation Conference, ASP-DAC 2018, Jeju, Korea (South), January 22-25, 2018. pages 623-630, IEEE, 2018. [doi]

Abstract

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