Empirical survival error potential weighted least squares for binary pattern classification - researchr publication authors

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Lei Sun, Kar-Ann Toh, Zhiping Lin, Badong Chen. Empirical survival error potential weighted least squares for binary pattern classification. In 13th International Conference on Control Automation Robotics & Vision, ICARCV 2014, Singapore, December 10-12, 2014. pages 949-952, IEEE, 2014. [doi]

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