Empirical survival error potential weighted least squares for binary pattern classification

Lei Sun, Kar-Ann Toh, Zhiping Lin, Badong Chen. Empirical survival error potential weighted least squares for binary pattern classification. In 13th International Conference on Control Automation Robotics & Vision, ICARCV 2014, Singapore, December 10-12, 2014. pages 949-952, IEEE, 2014. [doi]

Abstract

Abstract is missing.