Self-Testing of Embedded RAMs

Zuhi Sun, Laung-Terng Wang. Self-Testing of Embedded RAMs. In Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984. pages 148-156, IEEE Computer Society, 1984.

Authors

Zuhi Sun

This author has not been identified. Look up 'Zuhi Sun' in Google

Laung-Terng Wang

This author has not been identified. Look up 'Laung-Terng Wang' in Google