Zuhi Sun, Laung-Terng Wang. Self-Testing of Embedded RAMs. In Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984. pages 148-156, IEEE Computer Society, 1984.
@inproceedings{SunW84,
title = {Self-Testing of Embedded RAMs},
author = {Zuhi Sun and Laung-Terng Wang},
year = {1984},
tags = {testing},
researchr = {https://researchr.org/publication/SunW84},
cites = {0},
citedby = {0},
pages = {148-156},
booktitle = {Proceedings International Test Conference 1984, Philadelphia, PA, USA, October 1984},
publisher = {IEEE Computer Society},
}