Novel technique for built-in self-test of FPGA interconnects - researchr publication authors

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Xiaoling Sun, Jian Xu, Ben Chan, Pieter M. Trouborst. Novel technique for built-in self-test of FPGA interconnects. In Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. pages 795-803, IEEE Computer Society, 2000.

This author has not been identified. Look up 'Xiaoling Sun' in GoogleThis author has not been identified. Look up 'Jian Xu' in GoogleThis author has not been identified. Look up 'Ben Chan' in GoogleThis author has not been identified. Look up 'Pieter M. Trouborst' in Google

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