Xiaoling Sun, Jian Xu, Ben Chan, Pieter M. Trouborst. Novel technique for built-in self-test of FPGA interconnects. In Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. pages 795-803, IEEE Computer Society, 2000.
@inproceedings{SunXCT00,
title = {Novel technique for built-in self-test of FPGA interconnects},
author = {Xiaoling Sun and Jian Xu and Ben Chan and Pieter M. Trouborst},
year = {2000},
tags = {testing},
researchr = {https://researchr.org/publication/SunXCT00},
cites = {0},
citedby = {0},
pages = {795-803},
booktitle = {Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000},
publisher = {IEEE Computer Society},
}