Xiaoling Sun, Jian Xu, Pieter M. Trouborst. Testing Xilinx XC4000 Configurable Logic Blocks with Carry Logic Modules. In 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 24-26 October 2001, San Francisco, CA, USA, Proceedings. pages 221, IEEE Computer Society, 2001. [doi]
@inproceedings{SunXT01:0,
title = {Testing Xilinx XC4000 Configurable Logic Blocks with Carry Logic Modules},
author = {Xiaoling Sun and Jian Xu and Pieter M. Trouborst},
year = {2001},
url = {http://computer.org/proceedings/dft/1203/12030221abs.htm},
tags = {testing, logic},
researchr = {https://researchr.org/publication/SunXT01%3A0},
cites = {0},
citedby = {0},
pages = {221},
booktitle = {16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 24-26 October 2001, San Francisco, CA, USA, Proceedings},
publisher = {IEEE Computer Society},
isbn = {0-7695-1203-8},
}