Xiaoling Sun, Jian Xu, Pieter M. Trouborst. Testing Xilinx XC4000 Configurable Logic Blocks with Carry Logic Modules. In 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 24-26 October 2001, San Francisco, CA, USA, Proceedings. pages 221, IEEE Computer Society, 2001. [doi]
Abstract is missing.