S-band backscattering analysis of wheat using tower-based scatterometer - researchr publication authors

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Qikai Sun, Fengli Zhang, Yun Shao 0001, Li Liu, Guojun Wang, Xiaolin Bian, Kun Li, Xiaoli Wang. S-band backscattering analysis of wheat using tower-based scatterometer. In 2012 IEEE International Geoscience and Remote Sensing Symposium, Munich, Germany, July 22-27, 2012. pages 4621-4624, IEEE, 2012. [doi]

This author has not been identified. Look up 'Qikai Sun' in GoogleThis author has not been identified. Look up 'Fengli Zhang' in GoogleThis author has not been identified. Look up 'Yun Shao 0001' in GoogleThis author has not been identified. Look up 'Li Liu' in GoogleThis author has not been identified. Look up 'Guojun Wang' in GoogleThis author has not been identified. Look up 'Xiaolin Bian' in GoogleThis author has not been identified. Look up 'Kun Li' in GoogleThis author has not been identified. Look up 'Xiaoli Wang' in Google

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