Qikai Sun, Fengli Zhang, Yun Shao 0001, Li Liu, Guojun Wang, Xiaolin Bian, Kun Li, Xiaoli Wang. S-band backscattering analysis of wheat using tower-based scatterometer. In 2012 IEEE International Geoscience and Remote Sensing Symposium, Munich, Germany, July 22-27, 2012. pages 4621-4624, IEEE, 2012. [doi]
Abstract is missing.