Qikai Sun, Fengli Zhang, Yun Shao 0001, Li Liu, Guojun Wang, Xiaolin Bian, Kun Li, Xiaoli Wang. S-band backscattering analysis of wheat using tower-based scatterometer. In 2012 IEEE International Geoscience and Remote Sensing Symposium, Munich, Germany, July 22-27, 2012. pages 4621-4624, IEEE, 2012. [doi]
@inproceedings{SunZ0LWBLW12,
title = {S-band backscattering analysis of wheat using tower-based scatterometer},
author = {Qikai Sun and Fengli Zhang and Yun Shao 0001 and Li Liu and Guojun Wang and Xiaolin Bian and Kun Li and Xiaoli Wang},
year = {2012},
doi = {10.1109/IGARSS.2012.6350436},
url = {http://dx.doi.org/10.1109/IGARSS.2012.6350436},
researchr = {https://researchr.org/publication/SunZ0LWBLW12},
cites = {0},
citedby = {0},
pages = {4621-4624},
booktitle = {2012 IEEE International Geoscience and Remote Sensing Symposium, Munich, Germany, July 22-27, 2012},
publisher = {IEEE},
isbn = {978-1-4673-1160-1},
}