Yi Sun, Fanchen Zhang, Hui Jiang, Kundan Nepal, Jennifer Dworak, Theodore W. Manikas, R. Iris Bahar. Repurposing FPGAs for Tester Design to Enhance Field-Testing in a 3D Stack. J. Electronic Testing, 35(6):887-900, 2019. [doi]
@article{SunZJNDMB19,
title = {Repurposing FPGAs for Tester Design to Enhance Field-Testing in a 3D Stack},
author = {Yi Sun and Fanchen Zhang and Hui Jiang and Kundan Nepal and Jennifer Dworak and Theodore W. Manikas and R. Iris Bahar},
year = {2019},
doi = {10.1007/s10836-019-05845-5},
url = {https://doi.org/10.1007/s10836-019-05845-5},
researchr = {https://researchr.org/publication/SunZJNDMB19},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {35},
number = {6},
pages = {887-900},
}