A Winner-Take-All circuit with improved accuracy and tolerance to mismatch and process variations

Gopalakrishnan Sundararajan, Chris Winstead. A Winner-Take-All circuit with improved accuracy and tolerance to mismatch and process variations. In IEEE 56th International Midwest Symposium on Circuits and Systems, MWSCAS 2013, Columbus, OH, USA, August 4-7, 2013. pages 265-268, IEEE, 2013. [doi]

Abstract

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