Siddarth Sundaresan, Vamsi Mulpuri, Stoyan Jeliazkov, Ranbir Singh. Avalanche and Short-Circuit Robustness of 4600 V SiC DMOSFETs. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-7, IEEE, 2019. [doi]
Abstract is missing.