Siddarth Sundaresan, Vamsi Mulpuri, Jaehoon Park, Ranbir Singh. Reliability and Robustness Performance of 1200 V SiC DMOSFETs. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-4, IEEE, 2020. [doi]
Abstract is missing.