Stephen Sunter, Marampally Saikiran, Degang Chen 0001, Ashok Mathur. Innovative Practices Session: Applying Analog Scan to Industrial Circuits. In 44th IEEE VLSI Test Symposium, VTS 2026, Napa, CA, USA, April 27-29, 2026. pages 1, IEEE, 2026. [doi]
Abstract is missing.