A phase locking test solution for MEMS devices

Tareq Muhammad Supon, Rashid Rashidzadeh. A phase locking test solution for MEMS devices. In 22nd IEEE European Test Symposium, ETS 2017, Limassol, Cyprus, May 22-26, 2017. pages 1-6, IEEE, 2017. [doi]

Authors

Tareq Muhammad Supon

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Rashid Rashidzadeh

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