Tareq Muhammad Supon, Rashid Rashidzadeh. A phase locking test solution for MEMS devices. In 22nd IEEE European Test Symposium, ETS 2017, Limassol, Cyprus, May 22-26, 2017. pages 1-6, IEEE, 2017. [doi]
@inproceedings{SuponR17,
title = {A phase locking test solution for MEMS devices},
author = {Tareq Muhammad Supon and Rashid Rashidzadeh},
year = {2017},
doi = {10.1109/ETS.2017.7968236},
url = {https://doi.org/10.1109/ETS.2017.7968236},
researchr = {https://researchr.org/publication/SuponR17},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {22nd IEEE European Test Symposium, ETS 2017, Limassol, Cyprus, May 22-26, 2017},
publisher = {IEEE},
isbn = {978-1-5090-5457-2},
}