28 Challenge-Response Machine-Learning Resistant Strong-PUF in 14nm CMOS Featuring Stability-Aware Adversarial Challenge Selection

Vikram B. Suresh, Raghavan Kumar, Mark Anders, Himanshu Kaul, Vivek De, Sanu Mathew. 28 Challenge-Response Machine-Learning Resistant Strong-PUF in 14nm CMOS Featuring Stability-Aware Adversarial Challenge Selection. In IEEE Symposium on VLSI Circuits, VLSI Circuits 2020, Honolulu, HI, USA, June 16-19, 2020. pages 1-2, IEEE, 2020. [doi]

@inproceedings{SureshKAKDM20,
  title = {28 Challenge-Response Machine-Learning Resistant Strong-PUF in 14nm CMOS Featuring Stability-Aware Adversarial Challenge Selection},
  author = {Vikram B. Suresh and Raghavan Kumar and Mark Anders and Himanshu Kaul and Vivek De and Sanu Mathew},
  year = {2020},
  doi = {10.1109/VLSICircuits18222.2020.9162890},
  url = {https://doi.org/10.1109/VLSICircuits18222.2020.9162890},
  researchr = {https://researchr.org/publication/SureshKAKDM20},
  cites = {0},
  citedby = {0},
  pages = {1-2},
  booktitle = {IEEE Symposium on VLSI Circuits, VLSI Circuits 2020, Honolulu, HI, USA, June 16-19, 2020},
  publisher = {IEEE},
  isbn = {978-1-7281-9942-9},
}