Vikram B. Suresh, Priyamvada Vijayakumar, Sandip Kundu. On Screening Reliability Using Lithographic Process Corner Information Gleaned from Tester Measurements. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2011, 4-6 July 2011, Chennai, India. pages 248-253, IEEE Computer Society, 2011. [doi]
@inproceedings{SureshVK11, title = {On Screening Reliability Using Lithographic Process Corner Information Gleaned from Tester Measurements}, author = {Vikram B. Suresh and Priyamvada Vijayakumar and Sandip Kundu}, year = {2011}, doi = {10.1109/ISVLSI.2011.66}, url = {http://dx.doi.org/10.1109/ISVLSI.2011.66}, tags = {reliability}, researchr = {https://researchr.org/publication/SureshVK11}, cites = {0}, citedby = {0}, pages = {248-253}, booktitle = {IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2011, 4-6 July 2011, Chennai, India}, publisher = {IEEE Computer Society}, }