Vikram B. Suresh, Priyamvada Vijayakumar, Sandip Kundu. On Screening Reliability Using Lithographic Process Corner Information Gleaned from Tester Measurements. In IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2011, 4-6 July 2011, Chennai, India. pages 248-253, IEEE Computer Society, 2011. [doi]
Abstract is missing.