BTI-Induced Aging under Random Stress Waveforms: Modeling, Simulation and Silicon Validation

Ketul Sutaria, Athul Ramkumar, Rongjun Zhu, Renju Rajveev, Yao Ma, Yu Cao. BTI-Induced Aging under Random Stress Waveforms: Modeling, Simulation and Silicon Validation. In The 51st Annual Design Automation Conference 2014, DAC '14, San Francisco, CA, USA, June 1-5, 2014. pages 1-6, ACM, 2014. [doi]

Abstract

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