Gyuszi Suto, Geoff S. Greenleaf, Phanindra Bhagavatula, Heinrich R. Fischer, Sanjay K. Soni, Brian H. Miller, Renato Fernandes Hentschke. Declarative Language for Geometric Pattern Matching in VLSI Process Rule Modeling. In Ismail Bustany, William Swartz, editors, Proceedings of the 2019 International Symposium on Physical Design, ISPD 2019, San Francisco, CA, USA, April 14-17, 2019. pages 75-82, ACM, 2019. [doi]
Abstract is missing.