Ken Suzuki, Ryota Mizuno, Yutaro Nakoshi, Hideo Miura. Crystallinity Dependence of Long-Term Reliability of Electroplated Gold Thin-Film Interconnections. In 2019 International 3D Systems Integration Conference (3DIC), Sendai, Japan, October 8-10, 2019. pages 1-5, IEEE, 2019. [doi]
@inproceedings{SuzukiMNM19,
title = {Crystallinity Dependence of Long-Term Reliability of Electroplated Gold Thin-Film Interconnections},
author = {Ken Suzuki and Ryota Mizuno and Yutaro Nakoshi and Hideo Miura},
year = {2019},
doi = {10.1109/3DIC48104.2019.9058897},
url = {https://doi.org/10.1109/3DIC48104.2019.9058897},
researchr = {https://researchr.org/publication/SuzukiMNM19},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {2019 International 3D Systems Integration Conference (3DIC), Sendai, Japan, October 8-10, 2019},
publisher = {IEEE},
isbn = {978-1-7281-4870-0},
}