Concurrent testing of VLSI circuits using conservative logic

Gnanasekaran Swaminathan, James H. Aylor, Barry W. Johnson. Concurrent testing of VLSI circuits using conservative logic. In Proceedings of the 1990 IEEE International Conference on Computer Design: VLSI in Computers and Processors, ICCD 1990, Cambridge, MA, USA, 17-19 September, 1990. pages 60-65, IEEE, 1990. [doi]

Abstract

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