Reducing test cost through the use of digital testers for analog tests

John Sweeney, Alan Tsefrekas. Reducing test cost through the use of digital testers for analog tests. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 9, IEEE, 2005. [doi]

Authors

John Sweeney

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Alan Tsefrekas

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