John Sweeney, Alan Tsefrekas. Reducing test cost through the use of digital testers for analog tests. In Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005. pages 9, IEEE, 2005. [doi]
@inproceedings{SweeneyT05, title = {Reducing test cost through the use of digital testers for analog tests}, author = {John Sweeney and Alan Tsefrekas}, year = {2005}, doi = {10.1109/TEST.2005.1584003}, url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2005.1584003}, researchr = {https://researchr.org/publication/SweeneyT05}, cites = {0}, citedby = {0}, pages = {9}, booktitle = {Proceedings 2005 IEEE International Test Conference, ITC 2005, Austin, TX, USA, November 8-10, 2005}, publisher = {IEEE}, isbn = {0-7803-9038-5}, }