Layout regularity metric as a fast indicator of high variability circuits

Esraa Swillam, Kareem Madkour, Mohab Anis. Layout regularity metric as a fast indicator of high variability circuits. In 2013 IEEE International SOC Conference, Erlangen, Germany, September 4-6, 2013. pages 43-48, IEEE, 2013. [doi]

Authors

Esraa Swillam

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Kareem Madkour

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Mohab Anis

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