Esraa Swillam, Kareem Madkour, Mohab Anis. Layout regularity metric as a fast indicator of high variability circuits. In 2013 IEEE International SOC Conference, Erlangen, Germany, September 4-6, 2013. pages 43-48, IEEE, 2013. [doi]
@inproceedings{SwillamMA13,
title = {Layout regularity metric as a fast indicator of high variability circuits},
author = {Esraa Swillam and Kareem Madkour and Mohab Anis},
year = {2013},
doi = {10.1109/SOCC.2013.6749658},
url = {http://dx.doi.org/10.1109/SOCC.2013.6749658},
researchr = {https://researchr.org/publication/SwillamMA13},
cites = {0},
citedby = {0},
pages = {43-48},
booktitle = {2013 IEEE International SOC Conference, Erlangen, Germany, September 4-6, 2013},
publisher = {IEEE},
}