Infall Syafalni, Tsutomu Sasao, Xiaoqing Wen, Stefan Holst, Kohei Miyase. A soft-error tolerant TCAM using partial don't-care keys. In 20th IEEE European Test Symposium, ETS 2015, Cluj-Napoca, Romania, 25-29 May, 2015. pages 1-2, IEEE, 2015. [doi]
@inproceedings{SyafalniSWHM15,
title = {A soft-error tolerant TCAM using partial don't-care keys},
author = {Infall Syafalni and Tsutomu Sasao and Xiaoqing Wen and Stefan Holst and Kohei Miyase},
year = {2015},
doi = {10.1109/ETS.2015.7138743},
url = {http://dx.doi.org/10.1109/ETS.2015.7138743},
researchr = {https://researchr.org/publication/SyafalniSWHM15},
cites = {0},
citedby = {0},
pages = {1-2},
booktitle = {20th IEEE European Test Symposium, ETS 2015, Cluj-Napoca, Romania, 25-29 May, 2015},
publisher = {IEEE},
isbn = {978-1-4799-7603-4},
}